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1

Proton-induced transients in optocouplers: in-flight anomalies, ground irradiation test, mitigation and implications

LaBel, K.A., Marshall, P.W., Marshall, C.J., D'Ordine, M., Carts, M., Lum, G., Kim, H.S., Seidleck, C.M., Powell, T., Abbott, R., Barth, J., Stassinopoulos, E.G.

Journal:

IEEE Transactions on Nuclear Science

Year:

1997

Language:

english

File:

PDF, 773 KB

english, 1997

2

Use of Commercial FPGA-Based Evaluation Boards for Single-Event Testing of DDR2 and DDR3 SDRAMs

Ladbury, R. L., Berg, M. D., Wilcox, E. P., LaBel, K. A., Kim, H. S., Phan, A. M., Seidleck, C. M.

Journal:

IEEE Transactions on Nuclear Science

Year:

2013

Language:

english

File:

PDF, 2.53 MB

english, 2013

3

Heavy Ion and Proton-Induced Single Event Upset Characteristics of a 3-D NAND Flash Memory

Chen, Dakai, Wilcox, Edward, Ladbury, Raymond L., Seidleck, Christina, Kim, Hak, Phan, Anthony, LaBel, Kenneth A.

Journal:

IEEE Transactions on Nuclear Science

Year:

2018

Language:

english

File:

PDF, 2.53 MB

english, 2018

4

[IEEE 1998 IEEE Radiation Effects Data Workshop. NSREC 98. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference - Newport Beach, CA, USA (24 July 1998)] 1998 IEEE Radiation Effects Data Workshop. NSREC 98. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.98TH8385) - Single event effect and radiation damage results for candidate spacecraft electronics

O'Bryan, M.V., LaBel, K.A., Reed, R.A., Barth, J.L., Seidleck, C.M., Marshall, P., Marshall, C., Carts, M.

Year:

1998

Language:

english

File:

PDF, 896 KB

english, 1998

5

[IEEE IEEE Radiation Effects Data Workshop, 2005. - Seattle, WA, USA (11-15 July 2005)] IEEE Radiation Effects Data Workshop, 2005. - Validation and testing of design hardening for single event effects using the 8051 microcontroller

Howard, J.W., LaBel, K.A., Carts, M.A., Seidleck, C., Gambles, J.W., Ruggles, S.L.

Year:

2005

Language:

english

File:

PDF, 718 KB

english, 2005

6

[IEEE 2016 IEEE Aerospace Conference - Big Sky, MT, USA (2016.3.5-2016.3.12)] 2016 IEEE Aerospace Conference - Developing forward-looking metrics to interpret SPI and CPI performance indices for GSFC projects

Seidleck, Mark, Reynolds, Scott, Krygiel, Joseph

Year:

2016

Language:

english

File:

PDF, 547 KB

english, 2016

7

Evaluation of ADCI against convulsant and locomotor stimulant effects of cocaine: Comparison with structural analogs dizocilpine and carbamazepine

Brian K. Seidleck, Andrew Thurkauf, Jeffrey M. Witkin

Journal:

Pharmacology Biochemistry and Behavior

Year:

1994

Language:

english

File:

PDF, 629 KB

english, 1994

8

Mutation of human μ opioid receptor extracellular “disulfide cysteine” residues alters ligand binding but does not prevent receptor targeting to the cell plasma membrane

Peisu Zhang, Peter S Johnson, Christian Zöllner, Wenfei Wang, Zaijie Wang, Anita E Montes, Brian K Seidleck, Carrie J Blaschak, Christopher K Surratt

Journal:

Molecular Brain Research

Year:

1999

Language:

english

File:

PDF, 1.32 MB

english, 1999

9

[IEEE 2001 IEEE Radiation Effects Data Workshop. NSREC 2001. Workshop Record - Vancouver, BC, Canada (16-20 July 2001)] 2001 IEEE Radiation Effects Data Workshop. NSREC 2001. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.01TH8588) - Recent radiation damage and single event effect results for candidate spacecraft electronics

O'Bryan, M.V., LaBel, K.A., Reed, R.A., Ladbury, R.L., Howard, J.W., Buchner, S.P., Barth, J.L., Kniffin, S.D., Seidleck, C.M., Marshal, C.J., Marshal, P.W., Kim, H.S., Hawkins, D.K., Carts, M.A., For

Year:

2001

Language:

english

File:

PDF, 1.66 MB

english, 2001

10

[IEEE 2000 IEEE Radiation Effects Data Workshop. Workshop Record - Reno, NV, USA (24-28 July 2000)] 2000 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.00TH8527) - Radiation damage and single event effect results for candidate spacecraft electronics

O'Bryan, M.V., LaBel, K.A., Reed, R.A., Howard, J.W., Ladbury, R.L., Barth, J.L., Kniffin, S.D., Seidleck, C.M., Marshall, P.W., Marshall, C.J., Kim, H.S., Hawkins, D.K., Sanders, A.B., Carts, M.A., F

Year:

2000

Language:

english

File:

PDF, 1.39 MB

english, 2000

11

[IEEE 2003 IEEE Radiation Effects Data Workshop - Monterey, CA, USA (21-25 July 2003)] 2003 IEEE Radiation Effects Data Workshop - Single event effects results for candidate spacecraft electronics for NASA

O'Bryan, M.V., LaBel, K.A., Howard, J.W., Poivey, C., Ladbury, R.L., Kniffin, S.D., Buchner, S.P., Xapsos, M., Reed, R.A., Sanders, A.B., Seidleck, C.M., Marshall, C.J., Marshall, P.W., Titus, J., McM

Year:

2003

Language:

english

File:

PDF, 1001 KB

english, 2003

12

μ opiate receptor structure/function relationships III

CK Surratt, PS Johnson, A Moriwaki, BK Seidleck, CJ Blaschak, JB Wang, S Yuhasz, GR Uhl

Journal:

Regulatory Peptides

Year:

1994

Language:

english

File:

PDF, 160 KB

english, 1994

13

SEU Analysis of Complex Circuits Implemented in Actel RTAX-S FPGA Devices

Berg, M., Kim, H., Friendlich, M., Perez, C., Seidleck, C., LaBel, K., Ladbury, R.

Journal:

IEEE Transactions on Nuclear Science

Year:

2011

Language:

english

File:

PDF, 1.10 MB

english, 2011

14

[IEEE 2011 IEEE Radiation Effects Data Workshop (in conjunction with NSREC 2011) - Las Vegas, NV, USA (2011.07.25-2011.07.29)] 2011 IEEE Radiation Effects Data Workshop - Investigation of Current Spike Phenomena during Heavy Ion Irradiation of NAND Flash Memories

Oldham, Timothy R., Berg, Melanie, Friendlich, Mark, Wilcox, Ted, Seidleck, Christina, LaBel, Kenneth A., Irom, Farokh, Buchner, Steven P., McMorrow, Dale, Mavis, David G., Eaton, Paul H., Castillo, J

Year:

2010

Language:

english

File:

PDF, 4.24 MB

english, 2010

15

SEE and TID Characterization of an Advanced Commercial 2Gbit NAND Flash Nonvolatile Memory

Oldham, T. R., Ladbury, R. L., Friendlich, M., Kim, H. S., Berg, M. D., Irwin, T. L., Seidleck, C., LaBel, K. A.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 172 KB

english, 2006

16

[IEEE 2009 IEEE Radiation Effects Data Workshop (in Conjunction with NSREC 2009) - Quebec, Canada (2009.07.20-2009.07.24)] 2009 IEEE Radiation Effects Data Workshop - TID and SEE Response of Advanced Samsung and Micron 4G NAND Flash Memories for the NASA MMS Mission

Oldham, T. R., Friendlich, M. R., Sanders, A. B., Seidleck, C. M., Kim, H. S., Berg, M. D., LaBel, K. A.

Year:

2009

Language:

english

File:

PDF, 2.46 MB

english, 2009

17

Low Energy Proton Single-Event-Upset Test Results on 65 nm SOI SRAM

Heidel, David F., Marshall, Paul W., LaBel, Kenneth A., Schwank, James R., Rodbell, Kenneth P., Hakey, Mark C., Berg, Melanie D., Dodd, Paul E., Friendlich, Mark R., Phan, Anthony D., Seidleck, Christ

Journal:

IEEE Transactions on Nuclear Science

Year:

2008

Language:

english

File:

PDF, 565 KB

english, 2008

18

[IEEE 1996 IEEE Aerospace Applications Conference. Proceedings - Aspen, CO, USA (3-10 Feb. 1996)] 1996 IEEE Aerospace Applications Conference. Proceedings - Commercial microelectronics technologies for applications in the satellite radiation environment

LaBel, K.A., Gates, M.M., Moran, A.K., Marshall, P.W., Barth, J., Stassinopoulos, E.G., Seidleck, C.M., Dale, C.J.

Year:

1996

Language:

english

File:

PDF, 1.36 MB

english, 1996

19

[IEEE 2000 IEEE Aerospace Conference Proceedings - Big Sky, MT, USA (18-25 March 2000)] 2000 IEEE Aerospace Conference. Proceedings (Cat. No.00TH8484) - A roadmap for NASA's radiation effects research in emerging microelectronics and photonics

LaBel, K.A., Barnes, C.E., Marshall, P.W., Marshall, C.J., Johnston, A.H., Reed, R.A., Barth, J.L., Seidleck, C.M., Kayali, S.A., O'Bryan, M.V.

Year:

2000

Language:

english

File:

PDF, 916 KB

english, 2000

20

[IEEE Workshop Record. 1994 IEEE Radiation Effects Data Workshop - Tucson, AZ, USA (20 July 1994)] Workshop Record. 1994 IEEE Radiation Effects Data Workshop - Single event effect proton and heavy ion test results for candidate spacecraft electronics

LaBel, K.A., Moran, A.K., Hawkins, D.K., Cooley, J.A., Seidleck, C.M., Gates, M.M., Smith, B.S., Stassinopoulos, E.G., Marshall, P., Dale, C.

Year:

1994

Language:

english

File:

PDF, 513 KB

english, 1994

21

Flash Memory

Oldham, Timothy R., Friendlich, M., Carts, M. A., Seidleck, C. M., LaBel, Kenneth A.

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 631 KB

english, 2009

22

[IEEE 1995 IEEE Nuclear and Space Radiation Effects Conference (NSREC'95) - Madison, WI, USA (17-21 July 1995)] Proceedings of 1995 IEEE Nuclear and Space Radiation Effects Conference (NSREC'95) - Single event effect proton and heavy ion test results in support of candidate NASA programs

LaBel, K., Moran, A., Hawkins, D., Sanders, A., Seidleck, C., Kim, H., Fomey, J., Stassinopoulos, E.G., Marshall, P., Dale, C., Barry, R.

Year:

1995

Language:

english

File:

PDF, 1.07 MB

english, 1995

23

[IEEE Third European Conference on Radiation and its Effects on Components and Systems - Arcachon, France (18-22 Sept. 1995)] Proceedings of the Third European Conference on Radiation and its Effects on Components and Systems - SEE data from the APEX Cosmic Ray Upset Experiment: predicting the performance of commercial devices in space

Adolphsen, J., Barth, J.L., Stassinopoulos, E.G., Gruner, T., Wennersten, M., LaBel, K.A., Seidleck, C.M.

Year:

1996

Language:

english

File:

PDF, 1011 KB

english, 1996

24

[IEEE 1997 IEEE Radiation Effects Data Workshop NSREC Snowmass 1997. Workshop Record Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference - Snowmass Village, CO, USA (24 July 1997)] 1997 IEEE Radiation Effects Data Workshop NSREC Snowmass 1997. Workshop Record Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference - Single event effect test results for candidate spacecraft electronics

LaBel, K.A., Moran, A.K., Seidleck, C.M., Stassinopoulos, E.G., Barth, J.M., Marshall, P., Carts, M., Marshall, C., Kinnison, J., Carkhuff, B.

Year:

1997

Language:

english

File:

PDF, 621 KB

english, 1997

25

Test methodology for characterizing the SEE response of a commercial IEEE 1394 serial bus (FireWire)

Seidleck, C., Buchner, S., Kim, H.S., Marshall, P.W., LaBel, K.A.

Journal:

IEEE Transactions on Nuclear Science

Year:

2002

Language:

english

File:

PDF, 386 KB

english, 2002

26

SEE data from the APEX Cosmic Ray Upset experiment: predicting the performance of commercial devices in space

Adolphsen, J., Barth, J.L., Stassinopoulos, E.G., Gruner, T., Wennersten, M., LaBel, K.A., Seidleck, C.M.

Journal:

IEEE Transactions on Nuclear Science

Year:

1996

Language:

english

File:

PDF, 958 KB

english, 1996

27

[IEEE 2007 9th European Conference on Radiation and Its Effects on Components and Systems (RADECS 2007) - Deauville, France (2007.09.10-2007.09.14)] 2007 9th European Conference on Radiation and Its Effects on Components and Systems - Single Event Effects (SEE) response of embedded power PCs in a Xilinx Virtex-4 FPGA for a space application

Poivey, Christian, Berg, Melanie, Friendlich, Mark, Kim, Hak, Petrick, Dave, Stansberry, Scott, LaBel, Kenneth A., Seidleck, Christina, Phan, Anthony, Irwin, Tim

Year:

2007

Language:

english

File:

PDF, 3.79 MB

english, 2007

28

[IEEE Third European Conference on Radiation and its Effects on Components and Systems - Arcachon, France (18-22 Sept. 1995)] Proceedings of the Third European Conference on Radiation and its Effects on Components and Systems - Single event effect testing of the Intel 80386 family and the 80486 microprocessor

Moran, A., LaBel, K., Gates, M., Seidleck, C., McGraw, R., Broida, M., Firer, J., Sprehn, S.

Year:

1996

Language:

english

File:

PDF, 624 KB

english, 1996

29

Device-Orientation Effects on Multiple-Bit Upset in 65 nm SRAMs

Tipton, Alan D., Pellish, Jonathan A., Hutson, John M., Baumann, Robert, Deng, Xiaowei, Marshall, Andrew, Xapsos, Michael A., Kim, Hak S., Friendlich, Mark R., Campola, Michael J., Seidleck, Christina

Journal:

IEEE Transactions on Nuclear Science

Year:

2008

Language:

english

File:

PDF, 538 KB

english, 2008

30

[IEEE 1999 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference - Norfolk, VA, USA (12-16 July 1999)] 1999 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.99TH8463) - Recent radiation damage and single event effect results for microelectronics

O'Bryan, M.V., LaBel, K.A., Reed, R.A., Howard, J.W., Barth, J.L., Seidleck, C.M., Marshall, P.W., Marshall, C.J., Kim, H.S., Hawkins, D.K., Carts, M.A., Forslund, K.E.

Year:

1999

Language:

english

File:

PDF, 1.06 MB

english, 1999

31

A comparative study of heavy-ion and proton-induced bit-error sensitivity and complex burst-error modes in commercially available high-speed SiGe BiCMOS

Marshall, P., Carts, M., Campbell, A., Ladbury, R., Reed, R., Marshall, C., Currie, S., McMorrow, D., Buchner, S., Seidleck, C., Riggs, P., Fritz, K., Randall, B., Gilbert, B.

Journal:

IEEE Transactions on Nuclear Science

Year:

2004

Language:

english

File:

PDF, 245 KB

english, 2004

32

Selection of Well Contact Densities for Latchup-Immune Minimal-Area ICs

Dodds, N. A., Hutson, J. M., Pellish, J. A., Reed, R. A., Kim, H. S., Berg, M. D., Friendlich, M. R., Phan, A. M., Seidleck, C. M., Xapsos, M. A., Deng, X., Baumann, R. C., Schrimpf, R. D., King, M. P

Journal:

IEEE Transactions on Nuclear Science

Year:

2010

Language:

english

File:

PDF, 450 KB

english, 2010

33

Implications of single event effect characterization of hybrid DC-DC converters and a solid state power controller

LaBel, K.A., Barry, R.K., Castell, K., Kim, H.S., Seidleck, C.M.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 589 KB

english, 1995

34

[IEEE 2002 Nuclear and Space Radiation Effects Conference - Phoenix, AZ, USA (15-19 July 2002)] IEEE Radiation Effects Data Workshop - Current single event effects and radiation damage results for candidate spacecraft electronics

O'Bryan, M.V., LaBel, K.A., Ladbury, R.L., Poivey, C., Howard, J.W., Reed, R.A., Kniffin, S.D., Buchner, S.P., Bings, J.P., Titus, J.L., Clark, S.D., Turflinger, T.L., Seidleck, C.M., Marshall, C.J.,

Year:

2002

Language:

english

File:

PDF, 4.33 MB

english, 2002

35

Effect of Radiation Exposure on the Retention of Commercial NAND Flash Memory

Oldham, T. R., Chen, D., Friendlich, M., Carts, M. A., Seidleck, C. M., LaBel, K. A.

Journal:

IEEE Transactions on Nuclear Science

Year:

2011

Language:

english

File:

PDF, 834 KB

english, 2011

36

Single event effect ground test results for a fiber optic data interconnect and associated electronics

LaBel, K.A., Hawkins, D.K., Cooley, J.A., Seidleck, C.M., Marshall, P., Dale, C., Gates, M.M., Kim, H.S., Stassinopoulos, E.G.

Journal:

IEEE Transactions on Nuclear Science

Year:

1994

Language:

english

File:

PDF, 421 KB

english, 1994

37

Radiation effect characterization and test methods of single-chip and multi-chip stacked 16 Mbit DRAMs

LaBel, K.A., Gates, M.M., Moran, A.K., Kim, H.S., Seidleck, C.M., Marshall, P., Kinnison, J., Carkhuff, B.

Journal:

IEEE Transactions on Nuclear Science

Year:

1996

Language:

english

File:

PDF, 741 KB

english, 1996

38

[IEEE 2006 IEEE Radiation Effects Data Workshop - Ponte Vedra Beach, FL, USA (2006.07.17-2006.07.21)] 2006 IEEE Radiation Effects Data Workshop - Radiation Characteristics of a 0.11¿m Modified Commercial CMOS Process

Poivey, Christian, Kim, Hak, Berg, Melanie, Forney, Jim, Seidleck, Christina, Vilchis, Miguel, Phan, Anthony, Irwin, Tim, LaBel, Kenneth, Saigusa, Rajan, Mirabedini, Mohammad, Finlinson, Rick, Suvkhan

Year:

2006

Language:

english

File:

PDF, 4.01 MB

english, 2006

39

[IEEE 1996 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with The IEEE Nuclear and Space Radiation Effects Conference - Indian Wells, CA, USA (19 July 1996)] 1996 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with The IEEE Nuclear and Space Radiation Effects Conference - Current single event effect test results for candidate spacecraft electronics

LaBel, K.A., Moran, A.K., Hawkins, D.K., Sanders, A.B., Seidleck, C.M., Kim, H.S., Forney, J.E., Stassinopoulos, E.G., Marshall, P., Dale, C., Kinnison, J., Carkhuff, B.

Year:

1996

Language:

english

File:

PDF, 751 KB

english, 1996

40

Comparison of MIL-STD-1773 fiber optic data bus terminals: single event proton test irradiation, in-flight space performance, and prediction techniques

LaBel, K.A., Marshall, P.W., Marshall, C.J., Barth, J., Leidecker, H., Reed, R., Seidleck, C.M.

Journal:

IEEE Transactions on Nuclear Science

Year:

1998

Language:

english

File:

PDF, 632 KB

english, 1998

41

[IEEE 2009 European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Brugge, Belgium (2009.09.14-2009.09.18)] 2009 European Conference on Radiation and Its Effects on Components and Systems - Enhancing observability of signal composition response and error signatures during dynamic SEE analog to digital device testing

Berg, M., Buchner, S., Kim, H., Friendlich, M., Perez, C., Phan, A., Seidleck, C., LaBel, K.

Year:

2009

Language:

english

File:

PDF, 295 KB

english, 2009

42

Enhancing Observability of Signal Composition and Error Signatures During Dynamic SEE Analog to Digital Device Testing

Berg, Melanie D., Buchner, Stephen P., Kim, Hak, Friendlich, Mark, Perez, Christopher, Phan, Anthony M., Seidleck, Christina M., Label, Kenneth A., Kruckmeyer, Kirby

Journal:

IEEE Transactions on Nuclear Science

Year:

2010

Language:

english

File:

PDF, 748 KB

english, 2010

43

Single event effect testing of the Intel 80386 family and the 80486 microprocessor

Moran, A., LaBel, K., Gates, M., Seidleck, C., McGraw, R., Broida, M., Firer, J., Sprehn, S.

Journal:

IEEE Transactions on Nuclear Science

Year:

1996

Language:

english

File:

PDF, 645 KB

english, 1996

44

Single event upsets in the dual-port-board SRAMs of the MPTB experiment

Barak, J., Barth, J.L., Seidleck, C.M., Marshall, C.J., Marshall, P.W., Carts, M.A., Reed, R.A.

Journal:

IEEE Transactions on Nuclear Science

Year:

2000

Language:

english

File:

PDF, 410 KB

english, 2000

45

[IEEE RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294) - Cannes, France (15-19 Sept. 1997)] RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294) - Comparison of MIL-STD-1773 fiber optic data bus terminals: Single event proton test irradiation, in-flight space performance, and prediction techniques

LaBel, K.A., Marshall, P.W., Marshall, C.J., Barth, J., Leidecker, H., Reed, R., Seidleck, C.M.

Year:

1998

Language:

english

File:

PDF, 614 KB

english, 1998

46

[IEEE 2004 IEEE Radiation Effects Data Workshop - Atlanta, GA, USA (22 July 2004)] 2004 IEEE Radiation Effects Data Workshop (IEEE Cat. No.04TH8774) - Current single event effects results for candidate spacecraft electronics for NASA

O'Bryan, M.V., Seidleck, C.M., Carts, M.A., Howard, J.W., Kim, H.S., Forney, J.D., Label, K.A., Marshall, C.J., Reed, R.A., Sanders, A.B., Hawkins, D.K., Cox, S.R., Buchner, S.P., Oldham, T.R., Sutton

Year:

2004

Language:

english

File:

PDF, 2.81 MB

english, 2004

47

[IEEE 2008 IEEE Radiation Effects Data Workshop - Tucson, AZ (2008.07.14-2008.07.18)] 2008 IEEE Radiation Effects Data Workshop - TID and SEE Response of Advanced 4G NAND Flash Memories

Oldham, T. R., Suhail, M., Friendlich, M. R., Carts, M. A., Ladbury, R. L., Kim, H. S., Berg, M. D., Poivey, C., Buchner, S. P., Sanders, A. B., Seidleck, C. M., LaBel, K. A.

Year:

2008

Language:

english

File:

PDF, 1.17 MB

english, 2008

48

[IEEE Third European Conference on Radiation and its Effects on Components and Systems - Arcachon, France (18-22 Sept. 1995)] Proceedings of the Third European Conference on Radiation and its Effects on Components and Systems - Single event effect flight data analysis of multiple NASA spacecraft and experiments; implications to spacecraft electrical designs

Seidleck, C.M., LaBel, K.A., Moran, A.K., Gates, M.M., Barth, J.M., Stassinopoulos, E.G., Gruner, T.D.

Year:

1996

Language:

english

File:

PDF, 798 KB

english, 1996

49

[IEEE 1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 - Fontevraud, France (13-17 Sept. 1999)] 1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471) - Single event upsets in the dual-port-board SRAMs of the MPTB experiment

Barak, J., Barth, J.L., Seidleck, C.M., Marshall, C.J., Marshall, P.W., Carts, M.A., Reed, R.A.

Year:

2000

Language:

english

File:

PDF, 559 KB

english, 2000

50

[IEEE 2009 IEEE Aerospace conference - Big Sky, MT, USA (2009.03.7-2009.03.14)] 2009 IEEE Aerospace conference - The Fermi Gamma-Ray Space Telescope: Overview and early science results

Leibee, Jack, Seidleck, Mark, McEnery, Julie

Year:

2009

Language:

english

File:

PDF, 1.74 MB

english, 2009